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Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device
reliability. The absolute maximum ratings are stress ratings only.
Symbol
V CC
HV
I O+ /I O-
V ADIM
V RT
V CS
T A
T J
T STG
Parameter
IC Supply Voltage
High Voltage Sensing
Peak Drive Output Current (Sourcing / Sinking)
Analog Dimming
RT Pin Voltage
Allowable Current Sensing Detection Voltage
Operating Ambient Temperature Range
Operating Junction Temperature
Storage Temperature Range
Min.
-40
-40
-65
Max.
20
500
250
5
5
5
+125
+150
+150
Unit
V
V
mA
V
V
V
? C
? C
? C
θ JA
P D
Thermal Resistance Junction-Air
Power Dissipation
(1,2)
135
660
? C/W
mW
ESD
Electrostatic Discharge Capability
Human Body Model, JESD22-A114
Charged Device Model, JESD22-C101
2000
1000
V
Notes:
1.
2.
Thermal resistance test board. Size: 76.2 mm x 114.3 mm x 1.6 mm (1S0P); JEDEC standard: JESD51-2, JESD51-
3.
Assume no ambient airflow.
? 2011 Fairchild Semiconductor Corporation
FL7701 ? Rev. 1.0.4
4
www.fairchildsemi.com
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